DocumentCode :
1542065
Title :
High T/sub c/ dc SQUID utilizing bicrystal junctions with 30 degree misorientation angle
Author :
Enpuku, K. ; Minotani, T. ; Shiraishi, F. ; Kandori, A. ; Kawakami, S.
Author_Institution :
Dept. of Electron. Device Eng., Kyushu Univ., Fukuoka, Japan
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
3109
Lastpage :
3112
Abstract :
Performances of high T/sub c/ dc SQUID utilizing bicrystal junctions with 30/spl deg/ misorientation angle have been studied. Junction resistance R/sub s/=10 /spl Omega/ and critical current I/sub 0/=10-20 /spl mu/A can be obtained rather easily at T=77 K with this technology. As a result, voltage modulation depth as high as 50 /spl mu/V, and flux noise as low as 5 /spl mu//spl Phi//sub 0//Hz/sup 1/2/ obtained for the 100 pH-SQUID. The measured values of the voltage modulation depth agree reasonably well with the numerical simulation, while the measured values of the flux noise are about 2 or 3 times larger than the simulation. The reason for the high noise level is discussed by taking into account imperfection of junctions.
Keywords :
SQUIDs; bicrystals; high-temperature superconductors; superconducting device noise; DC SQUID; bicrystal junction; critical current; flux noise; high T/sub c/ superconductor; misorientation angle; numerical simulation; surface resistance; voltage modulation depth; Circuit noise; Circuit simulation; Frequency; Inductance; Low-frequency noise; Noise measurement; Numerical simulation; SQUIDs; Transfer functions; Voltage;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.783687
Filename :
783687
Link To Document :
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