• DocumentCode
    1542115
  • Title

    Accurate determination of the weak optical absorption of piezoelectric crystals used as capacitive massive bolometers

  • Author

    Bezançon, F. ; Mangin, J. ; Strimer, P. ; Maglione, M.

  • Author_Institution
    CNRS, Bourgogne Univ., Dijon, France
  • Volume
    37
  • Issue
    11
  • fYear
    2001
  • fDate
    11/1/2001 12:00:00 AM
  • Firstpage
    1396
  • Lastpage
    1400
  • Abstract
    The resonant frequency in a piezoelectric crystal is strongly temperature dependent. This physical property may be exploited to measure small overheating of the material induced by a weak optical absorption. A sample of congruent LiNbO3 is exposed to a laser beam, with a wavelength λ chosen inside the transparency window. One of the piezoelectric resonances is selected and used as an internal thermal probe to record both dynamical and steady state overheating induced by the residual absorption k of the material. A bolometer-type equation describing the time dependence of the sample temperature is used to determine k accurately, the capacitance-rather than frequency-being the temperature-sensitive electrical parameter of the resonance
  • Keywords
    bolometers; light absorption; measurement errors; photocapacitance; photorefractive materials; piezoelectric materials; LiNbO3; accurate determination; bolometer-type equation; capacitive massive bolometers; congruent LiNbO3; internal thermal probe; laser beam; piezoelectric crystal; piezoelectric crystals; piezoelectric resonances; residual absorption; resonant frequency; sample temperature; small overheating; steady state overheating; strongly temperature dependent; temperature-sensitive electrical parameter; time dependence; transparency window; weak optical absorption; Absorption; Crystalline materials; Laser beams; Laser theory; Optical materials; Optical recording; Resonance; Resonant frequency; Temperature dependence; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.958353
  • Filename
    958353