• DocumentCode
    1542178
  • Title

    Sensitivity analysis of structure in GMR/insulator/SAL sensor

  • Author

    Negoro, Yoichi ; Okabe, Akihiko ; Kano, Hiroshi ; Kagawa, Kiyoshi ; Suzuki, Atsuko ; Yaoi, Toshihiko ; Hayashi, Kazuhiko

  • Author_Institution
    Res. Center, Sony Corp., Yokohama, Japan
  • Volume
    33
  • Issue
    2
  • fYear
    1997
  • fDate
    3/1/1997 12:00:00 AM
  • Firstpage
    2167
  • Lastpage
    2170
  • Abstract
    A guideline for the optimum design of the soft adjacent layer (SAL)-biased giant magnetoresistive (GMR) sensors, which are a promising MR head for use at high areal densities, with electromagnetic field computation based on a 2D finite element method is reported. The bias level is highly sensitive to the element height, and it is desirable that element height should be less than 1 μm for the shielded sensor
  • Keywords
    design engineering; electromagnetic fields; finite element analysis; giant magnetoresistance; magnetic sensors; magnetoresistive devices; optimisation; sensitivity analysis; 2D finite element method; bias level; electromagnetic field computation; element height; giant magnetoresistive sensors; optimum design guidelines; shielded sensor; soft adjacent layer biasing; Electromagnetic fields; Giant magnetoresistance; Insulation; Magnetic films; Magnetic heads; Magnetic materials; Magnetic multilayers; Magnetic sensors; Sensitivity analysis; Sensor phenomena and characterization;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.582761
  • Filename
    582761