DocumentCode
1542361
Title
An Efficient Projector-Based Passivity Test for Descriptor Systems
Author
Zhang, Zheng ; Wong, Ngai
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
Volume
29
Issue
8
fYear
2010
Firstpage
1203
Lastpage
1214
Abstract
An efficient passivity test based on canonical projector techniques is proposed for descriptor systems (DSs) widely encountered in circuit and system modeling. The test features a natural flow that first evaluates the index of a DS, followed by possible decoupling into its proper and improper subsystems. Explicit state-space formulations for respective subsystems are derived to facilitate further processing such as model order reduction and/or passivity enforcement. Efficient projector construction and a fast generalized Hamiltonian test for the proper-part passivity are also elaborated. Numerical examples then confirm the superiority of the proposed method over existing passivity tests for DSs based on linear matrix inequalities or skew-Hamiltonian/Hamiltonian matrix pencils.
Keywords
circuit testing; linear matrix inequalities; state-space methods; canonical projector techniques; descriptor systems; efficient projector-based passivity test; explicit state-space formulations; fast generalized Hamiltonian test; linear matrix inequalities; skew-Hamiltonian matrix pencil; system modeling; Circuit simulation; Circuit stability; Circuit testing; Circuits and systems; Decision support systems; Differential equations; Linear matrix inequalities; Linear systems; State-space methods; System testing; Canonical projector; descriptor system (DS); generalized Hamiltonian; passivity;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2010.2049048
Filename
5512691
Link To Document