DocumentCode :
1542361
Title :
An Efficient Projector-Based Passivity Test for Descriptor Systems
Author :
Zhang, Zheng ; Wong, Ngai
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
Volume :
29
Issue :
8
fYear :
2010
Firstpage :
1203
Lastpage :
1214
Abstract :
An efficient passivity test based on canonical projector techniques is proposed for descriptor systems (DSs) widely encountered in circuit and system modeling. The test features a natural flow that first evaluates the index of a DS, followed by possible decoupling into its proper and improper subsystems. Explicit state-space formulations for respective subsystems are derived to facilitate further processing such as model order reduction and/or passivity enforcement. Efficient projector construction and a fast generalized Hamiltonian test for the proper-part passivity are also elaborated. Numerical examples then confirm the superiority of the proposed method over existing passivity tests for DSs based on linear matrix inequalities or skew-Hamiltonian/Hamiltonian matrix pencils.
Keywords :
circuit testing; linear matrix inequalities; state-space methods; canonical projector techniques; descriptor systems; efficient projector-based passivity test; explicit state-space formulations; fast generalized Hamiltonian test; linear matrix inequalities; skew-Hamiltonian matrix pencil; system modeling; Circuit simulation; Circuit stability; Circuit testing; Circuits and systems; Decision support systems; Differential equations; Linear matrix inequalities; Linear systems; State-space methods; System testing; Canonical projector; descriptor system (DS); generalized Hamiltonian; passivity;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2010.2049048
Filename :
5512691
Link To Document :
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