• DocumentCode
    1542361
  • Title

    An Efficient Projector-Based Passivity Test for Descriptor Systems

  • Author

    Zhang, Zheng ; Wong, Ngai

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
  • Volume
    29
  • Issue
    8
  • fYear
    2010
  • Firstpage
    1203
  • Lastpage
    1214
  • Abstract
    An efficient passivity test based on canonical projector techniques is proposed for descriptor systems (DSs) widely encountered in circuit and system modeling. The test features a natural flow that first evaluates the index of a DS, followed by possible decoupling into its proper and improper subsystems. Explicit state-space formulations for respective subsystems are derived to facilitate further processing such as model order reduction and/or passivity enforcement. Efficient projector construction and a fast generalized Hamiltonian test for the proper-part passivity are also elaborated. Numerical examples then confirm the superiority of the proposed method over existing passivity tests for DSs based on linear matrix inequalities or skew-Hamiltonian/Hamiltonian matrix pencils.
  • Keywords
    circuit testing; linear matrix inequalities; state-space methods; canonical projector techniques; descriptor systems; efficient projector-based passivity test; explicit state-space formulations; fast generalized Hamiltonian test; linear matrix inequalities; skew-Hamiltonian matrix pencil; system modeling; Circuit simulation; Circuit stability; Circuit testing; Circuits and systems; Decision support systems; Differential equations; Linear matrix inequalities; Linear systems; State-space methods; System testing; Canonical projector; descriptor system (DS); generalized Hamiltonian; passivity;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2010.2049048
  • Filename
    5512691