DocumentCode :
1542399
Title :
Development of gamma-ray monitor using CdZnTe semiconductor detector
Author :
Rasolonjatovo, D.A.H. ; Shiomi, T. ; Nakamura, T. ; Nishizawa, H. ; Tsudaka, Y. ; Fujiwara, H. ; Araki, H. ; Matsuo, K.
Author_Institution :
Dept. of Quantum Sci. & Energy Eng., Tohoku Univ., Sendai, Japan
Volume :
48
Issue :
4
fYear :
2001
fDate :
8/1/2001 12:00:00 AM
Firstpage :
1570
Lastpage :
1576
Abstract :
In this study, we aimed to develop a new X-ray and gamma-ray monitor using the CdZnTe semiconductor detector, which has high sensitivity at room temperature. The pulse height spectra and the detection efficiencies of 10 mm×10 mm by 2 mm thick CdZnTe detector were measured in the energy range of 10 keV to 1.8 MeV by using monoenergetic X-ray and gamma-ray sources. The measured results showed very good agreement with the results calculated using the EGS4 Monte Carlo code taking into account the charge collection efficiency in the detector. By using two CZT detectors of 10 mm×10 mm×2 mm and 3 mm ×3 mm×2 mm coupled with a filter, the weighted sum of a few energy channels with different cutoff energies was finally found to realize a flat energy response with an equivalent dose (counts per μSv) within ±30% or ±10% deviation
Keywords :
II-VI semiconductors; Monte Carlo methods; X-ray detection; cadmium compounds; gamma-ray detection; semiconductor counters; wide band gap semiconductors; CZT detectors; CdZnTe; CdZnTe semiconductor detector; EGS4 Monte Carlo code; charge collection efficiency; detection efficiencies; equivalent dose; flat energy response; gamma-ray monitor; monoenergetic X-ray sources; monoenergetic gamma-ray sources; pulse height spectra; Current measurement; Energy measurement; Gamma ray detection; Gamma ray detectors; Monitoring; Pulse measurements; Temperature sensors; Thickness measurement; X-ray detection; X-ray detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.958398
Filename :
958398
Link To Document :
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