• DocumentCode
    1542408
  • Title

    An analytical maximum toggle frequency expression and its application to optimizing high-speed ECL frequency dividers

  • Author

    Fang, Wen ; Brunnschweiler, Arthur ; Ashburn, Peter

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • Volume
    25
  • Issue
    4
  • fYear
    1990
  • fDate
    8/1/1990 12:00:00 AM
  • Firstpage
    920
  • Lastpage
    931
  • Abstract
    A novel method is used to analyze static and regenerative frequency dividers by relating their performance to that of the constituent EXCLUSIVE-OR (XOR) gates. It is found that the behavior of the propagation delay of XOR gates is quite linear, and this allows the derivation of a propagation delay expression for XOR gates using a sensitivity analysis. The validity of the expression is checked by comparison with SPICE simulations and with results from the literature, and agreement to 10% is obtained. It has been found that this expression can be used to accurately predict the maximum toggle frequency of frequency dividers. Using this expression, it has also been verified that the maximum toggle frequency of regenerative frequency dividers is about twice as high as that of static frequency dividers. In order to optimize frequency dividers, figures of merit for frequency dividers realized in silicon and AlGaAs-GaAs technologies are proposed
  • Keywords
    bipolar integrated circuits; delays; emitter-coupled logic; frequency dividers; integrated logic circuits; logic design; sensitivity analysis; AlGaAs-GaAs; ECL frequency dividers; EXCLUSIVE-OR; Si; XOR gates; logic circuits; maximum toggle frequency expression; propagation delay; regenerative frequency dividers; sensitivity analysis; static frequency dividers; Capacitance; Circuits; Current density; Frequency conversion; Gallium arsenide; Optimization methods; Performance analysis; Propagation delay; Sensitivity analysis; Silicon;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.58284
  • Filename
    58284