Title :
Fault detection in a tristate system environment
Author :
Feng, Wenyi ; Karimi, Farzin ; Lombardi, Fabrizio
Abstract :
Embedded computers commonly rely on multiple-board systems, called tristate system environments. These environments consist of an interconnect and drivers or receivers with tristate features and boundary scan capabilities. The authors present a comprehensive fault model that provides 100 percent fault coverage and minimizes test set size
Keywords :
automatic testing; boundary scan testing; circuit CAD; embedded systems; fault diagnosis; integrated circuit testing; interconnections; boundary scan capabilities; comprehensive fault model; embedded computers; fault coverage; fault detection; interconnect; multiple-board systems; test set size; tristate features; tristate system environment; Assembly systems; Digital systems; Embedded computing; Fault detection; Integrated circuit testing; Logic testing; Registers; System testing;
Journal_Title :
Micro, IEEE
