DocumentCode
1542503
Title
Design of bipolar imaging device (BASIS)
Author
Nakamura, Yoshio ; Ohzu, Hayao ; Miyawaki, Mamoru ; Tanaka, Nonuyoshi ; Ohmi, Tadahiro
Author_Institution
Canon Inc., Kanagawa, Japan
Volume
38
Issue
5
fYear
1991
fDate
5/1/1991 12:00:00 AM
Firstpage
1028
Lastpage
1036
Abstract
The design methodology of a bipolar imaging device, BASIS (base-stored image sensor), with a capacitor-loaded emitter-follower circuitry, is established by analyzing the basic operation of BASIS and the generation mechanism of fixed pattern noise where theoretical results coincide well with experimental results. From this methodology, a wide dynamic range of linearity is assured by optimizing the forward-bias voltage in readout operation, while high sensitivity is realized by making the base-to-collector junction capacitance C bc as small as possible and by designing the emitter common current gain h FE of a phototransistor in a pixel to be as high as possible. In order to reduce fixed pattern noise, nonuniformities of h FE and C bc should be made as small as possible by improving fabrication process technology, while the bootstrap factor k f defined in this theory should be as small as possible
Keywords
bipolar integrated circuits; image sensors; semiconductor device models; base-stored image sensor; bipolar imaging device; capacitor-loaded emitter-follower circuitry; dynamic range; experimental results; fixed pattern noise; forward-bias voltage; generation mechanism; operation; phototransistor; Circuit noise; Design methodology; Design optimization; Dynamic range; Image analysis; Image sensors; Iron; Linearity; Noise generators; Pattern analysis;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.78375
Filename
78375
Link To Document