• DocumentCode
    1542503
  • Title

    Design of bipolar imaging device (BASIS)

  • Author

    Nakamura, Yoshio ; Ohzu, Hayao ; Miyawaki, Mamoru ; Tanaka, Nonuyoshi ; Ohmi, Tadahiro

  • Author_Institution
    Canon Inc., Kanagawa, Japan
  • Volume
    38
  • Issue
    5
  • fYear
    1991
  • fDate
    5/1/1991 12:00:00 AM
  • Firstpage
    1028
  • Lastpage
    1036
  • Abstract
    The design methodology of a bipolar imaging device, BASIS (base-stored image sensor), with a capacitor-loaded emitter-follower circuitry, is established by analyzing the basic operation of BASIS and the generation mechanism of fixed pattern noise where theoretical results coincide well with experimental results. From this methodology, a wide dynamic range of linearity is assured by optimizing the forward-bias voltage in readout operation, while high sensitivity is realized by making the base-to-collector junction capacitance C bc as small as possible and by designing the emitter common current gain hFE of a phototransistor in a pixel to be as high as possible. In order to reduce fixed pattern noise, nonuniformities of hFE and Cbc should be made as small as possible by improving fabrication process technology, while the bootstrap factor kf defined in this theory should be as small as possible
  • Keywords
    bipolar integrated circuits; image sensors; semiconductor device models; base-stored image sensor; bipolar imaging device; capacitor-loaded emitter-follower circuitry; dynamic range; experimental results; fixed pattern noise; forward-bias voltage; generation mechanism; operation; phototransistor; Circuit noise; Design methodology; Design optimization; Dynamic range; Image analysis; Image sensors; Iron; Linearity; Noise generators; Pattern analysis;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.78375
  • Filename
    78375