DocumentCode :
1542560
Title :
Production and testing of the DØ silicon microstrip tracker
Author :
Filthaut, F.
Author_Institution :
Dept. of Exp. High Energy Phys., Nijmegen Univ., Netherlands
Volume :
48
Issue :
4
fYear :
2001
fDate :
8/1/2001 12:00:00 AM
Firstpage :
1002
Lastpage :
1006
Abstract :
The DØ collaboration is completing production of a 793 000 channel silicon strip tracking system for the DØ upgrade. The tracker consists of 768 ladder and wedge assemblies including both single- and double-sided detectors. The production process includes burn-in of electronics, mechanical assembly under coordinate measuring machines, wire bonding, repair of bad channels, detector burn-in, laser testing, and final assembly. We describe observed failure modes of the detectors, including microdischarge and lithography defects. We present results of the production and testing process and describe the anticipated performance of the detector. Lessons for future production of large-scale tracking systems are discussed
Keywords :
lead bonding; semiconductor device testing; silicon radiation detectors; DO silicon microstrip tracker; Si; coordinate measuring machines; detector burn-in; double-sided detectors; failure modes; final assembly; ladder and wedge assemblies; large-scale tracking systems; laser testing; lithography defects; microdischarge; silicon strip tracking system; single-sided detectors; wire bonding; Assembly; Collaboration; Coordinate measuring machines; Detectors; Electronic equipment testing; Microstrip; Production systems; Silicon; Strips; Wire;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.958713
Filename :
958713
Link To Document :
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