Title :
Properties of rough interfaces in superconductors with d-wave pairing
Author :
Golubov, A. ; Kupriyanov, M.Yu.
Author_Institution :
Dept. of Appl. Phys., Twente Univ., Enschede, Netherlands
fDate :
6/1/1999 12:00:00 AM
Abstract :
Theoretical model of a rough interface in a superconductor with d-wave symmetry of the order parameter is proposed. The surface roughness is introduced by means of a surface layer with small electronic mean free path. The proximity effect between such a layer and a bulk d-wave superconductor is studied theoretically in the framework of the quasiclassical Eilenberger theory. It is shown that as a result of strong scattering in the interlayer the d-wave component of the order parameter near the interface is reduced while the s-wave component localized near the interface is generated. Angular and spatial structure of the pair potential and the electronic density of states near the interface is calculated. The interplay of the zero-energy (midgap) and finite-energy bound states leads to peculiarities in the energy dependence of the angle-averaged density of states. We argue that the model is relevant for the description of rough interfaces in high T/sub c/ superconductors. In the framework of the present approach we calculate the Josephson critical current for several types of junctions with rough interfaces.
Keywords :
Josephson effect; critical currents; high-temperature superconductors; proximity effect (superconductivity); rough surfaces; Josephson junction; bound states; critical current; d-wave pairing; electron scattering; electronic density of states; electronic mean free path; high-T/sub c/ superconductor; order parameter; pair potential; proximity effect; quasiclassical Eilenberger theory; rough interface; surface roughness; Conductors; High temperature superconductors; Nuclear physics; Proximity effect; Reflection; Rough surfaces; Superconducting epitaxial layers; Superconducting materials; Superconductivity; Surface roughness;
Journal_Title :
Applied Superconductivity, IEEE Transactions on