• DocumentCode
    154265
  • Title

    Cu pattern etching by oxygen gas cluster ion beams with acetic acid vapor

  • Author

    Toyoda, Noriaki ; Kojima, Masaru ; Hinoura, R. ; Yamaguchi, Akira ; Hara, Kentaro ; Yamada, Isao

  • Author_Institution
    Grad. Sch. of Eng., Univ. of Hyogo, Himeji, Japan
  • fYear
    2014
  • fDate
    20-23 May 2014
  • Firstpage
    277
  • Lastpage
    280
  • Abstract
    Halogen free and low-temperature Cu etching was carried out using a gas cluster ion beam (GCIB) with acetic acid vapor. A very shallow Cu surface was oxidized by oxygen GCIB (O2-GCIB). Simultaneously, reactions between CuO and acetic acid occurred, and reaction products were desorbed by local heating of O2-GCIB irradiation. Thus, Cu etching at a low-temperature (<;60 °C) was achieved. From cross-sectional images of Cu pattern with line width of 100 nm, anisotropic Cu etching was carried out with this technique.
  • Keywords
    copper; etching; ion beam effects; oxygen; CuO; acetic acid vapor; gas cluster ion beams; local heating; oxygen GCIB; pattern etching; Abstracts; Acceleration; Etching; Heating; Ions; Needles; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4799-5016-4
  • Type

    conf

  • DOI
    10.1109/IITC.2014.6831879
  • Filename
    6831879