Title : 
Cu pattern etching by oxygen gas cluster ion beams with acetic acid vapor
         
        
            Author : 
Toyoda, Noriaki ; Kojima, Masaru ; Hinoura, R. ; Yamaguchi, Akira ; Hara, Kentaro ; Yamada, Isao
         
        
            Author_Institution : 
Grad. Sch. of Eng., Univ. of Hyogo, Himeji, Japan
         
        
        
        
        
        
            Abstract : 
Halogen free and low-temperature Cu etching was carried out using a gas cluster ion beam (GCIB) with acetic acid vapor. A very shallow Cu surface was oxidized by oxygen GCIB (O2-GCIB). Simultaneously, reactions between CuO and acetic acid occurred, and reaction products were desorbed by local heating of O2-GCIB irradiation. Thus, Cu etching at a low-temperature (<;60 °C) was achieved. From cross-sectional images of Cu pattern with line width of 100 nm, anisotropic Cu etching was carried out with this technique.
         
        
            Keywords : 
copper; etching; ion beam effects; oxygen; CuO; acetic acid vapor; gas cluster ion beams; local heating; oxygen GCIB; pattern etching; Abstracts; Acceleration; Etching; Heating; Ions; Needles; Threshold voltage;
         
        
        
        
            Conference_Titel : 
Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International
         
        
            Conference_Location : 
San Jose, CA
         
        
            Print_ISBN : 
978-1-4799-5016-4
         
        
        
            DOI : 
10.1109/IITC.2014.6831879