DocumentCode
154265
Title
Cu pattern etching by oxygen gas cluster ion beams with acetic acid vapor
Author
Toyoda, Noriaki ; Kojima, Masaru ; Hinoura, R. ; Yamaguchi, Akira ; Hara, Kentaro ; Yamada, Isao
Author_Institution
Grad. Sch. of Eng., Univ. of Hyogo, Himeji, Japan
fYear
2014
fDate
20-23 May 2014
Firstpage
277
Lastpage
280
Abstract
Halogen free and low-temperature Cu etching was carried out using a gas cluster ion beam (GCIB) with acetic acid vapor. A very shallow Cu surface was oxidized by oxygen GCIB (O2-GCIB). Simultaneously, reactions between CuO and acetic acid occurred, and reaction products were desorbed by local heating of O2-GCIB irradiation. Thus, Cu etching at a low-temperature (<;60 °C) was achieved. From cross-sectional images of Cu pattern with line width of 100 nm, anisotropic Cu etching was carried out with this technique.
Keywords
copper; etching; ion beam effects; oxygen; CuO; acetic acid vapor; gas cluster ion beams; local heating; oxygen GCIB; pattern etching; Abstracts; Acceleration; Etching; Heating; Ions; Needles; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International
Conference_Location
San Jose, CA
Print_ISBN
978-1-4799-5016-4
Type
conf
DOI
10.1109/IITC.2014.6831879
Filename
6831879
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