Title :
New low-noise output amplifier for high-definition CCD image sensor
Author :
Mutoh, Nobuhiko ; Morimoto, Michihiro ; Nishimura, Miyo ; Teranishi, Nobukazu ; Oda, E.
Author_Institution :
NEC Corp., Kanagawa, Japan
fDate :
5/1/1991 12:00:00 AM
Abstract :
A new low-noise charge-coupled-device (CCD) output amplifier, the RJG detector, has been developed. The RJG detector incorporates a JFET which has an electrically floating ring-junction gate (RJG). The operating principle of the amplifier is that signal charges, transferred from the CCD into the RJG, directly modulate the drain current in the detection JFET. The performance of the detector was evaluated by operating test devices under a 37-MHz clock frequency, which is the same frequency as that for the horizontal CCD operation in the recently developed 2-million-pixel high-definition CCD image sensor. It was found that 1/f noise was reduced by introducing the JFET and that reset noise was completely eliminated by achieving complete charge transfer through the reset operation. As a result, input referred noise equivalent electrons within the 18.5-MHz baseband were reduced to 17 (electrons)
Keywords :
CCD image sensors; amplifiers; electron device noise; high definition television; 1/f noise; 37 MHz; HDTV; JFET; charge coupled device imagers; charge transfer; clock frequency; floating ring-junction gate; high-definition CCD image sensor; low-noise output amplifier; noise equivalent electrons; reset noise; reset operation; Charge coupled devices; Charge transfer; Charge-coupled image sensors; Clocks; Detectors; Electrons; Frequency; Low-noise amplifiers; Noise reduction; Testing;
Journal_Title :
Electron Devices, IEEE Transactions on