DocumentCode :
1542783
Title :
Growth and properties of NdBa/sub 2/Cu/sub 3/O/sub 7-/spl delta///PrBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// quasi-homostructures for the fabrication of electronic devices
Author :
Alvarez, G.A. ; Wen, J.G. ; Wang, F. ; Utagawa, T. ; Enomoto, Y.
Author_Institution :
Supercond. Res. Lab., ISTEC, Tokyo, Japan
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
3017
Lastpage :
3020
Abstract :
We report on well-characterized c-axis quasi-homoepitaxial multilayers made of NdBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (NBCO) and PrBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (PBCO) films with very smooth surface morphology and high crystallinity, grown on SrTiO/sub 3/ substrates by pulsed laser deposition (PLD). X-ray diffraction (XRD), transmission electron microscopy (RBS) and Rutherford backscattering spectrometry (RBS) analyses provide evidence of long-range crystalline perfection, and a well-equilibrated and relaxed crystal. Furthermore, high quality junctions were fabricated from c-axis-oriented NBCO/PBCO/NBCO multilayers. The current-voltage characteristics (CVC) exhibit supercurrent and quasi-particle tunneling that is commonly observed for superconductor-insulator-superconductor (SIS) junctions. Our results show the importance of using barrier layer materials of PBCO sandwiched between NBCO electrodes for the fabrication of electronic devices.
Keywords :
Rutherford backscattering; X-ray diffraction; barium compounds; high-temperature superconductors; neodymium compounds; praseodymium compounds; pulsed laser deposition; superconducting epitaxial layers; superconductive tunnelling; transmission electron microscopy; NBCO/PBCO/NBCO quasi-homoepitaxial multilayer; NdBa/sub 2/Cu/sub 3/O/sub 7/-PrBa/sub 2/Cu/sub 3/O/sub 7/; Rutherford backscattering spectrometry; SrTiO/sub 3/; SrTiO/sub 3/ substrate; X-ray diffraction; barrier layer; current-voltage characteristics; electronic device fabrication; film crystallinity; growth; pulsed laser deposition; quasi-particle tunneling; superconductor-insulator-superconductor junction; surface morphology; transmission electron microscop; Crystallization; Electrons; Nonhomogeneous media; Optical pulses; Pulsed laser deposition; Surface emitting lasers; Surface morphology; X-ray diffraction; X-ray lasers; X-ray scattering;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.621961
Filename :
621961
Link To Document :
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