Title :
Atomic flux divergence based current conversion scheme for signal line electromigration reliability assessment
Author :
Zhong Guan ; Marek-Sadowska, Malgorzata ; Nassif, S. ; Baozhen Li
Author_Institution :
UC Santa Barbara, Santa Barbara, CA, USA
Abstract :
In this paper, we study electromigration (EM) reliability of signal lines. We propose a general model for current conversion from pulsed DC to steady DC based on the consistency of maximal atomic flux divergence. Both long and short lead lines with high frequency current are considered. The calculated effective steady DC agrees with the measured results. Our conversion scheme can be applied also to signal lines with complex current paths.
Keywords :
DC-DC power convertors; electromigration; DC-DC current conversion; atomic flux divergence; current conversion scheme; signal line electromigration reliability; Atomic measurements; Current density; Electromigration; Mathematical model; Reliability; Stress;
Conference_Titel :
Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4799-5016-4
DOI :
10.1109/IITC.2014.6831886
