DocumentCode
154279
Title
Atomic flux divergence based current conversion scheme for signal line electromigration reliability assessment
Author
Zhong Guan ; Marek-Sadowska, Malgorzata ; Nassif, S. ; Baozhen Li
Author_Institution
UC Santa Barbara, Santa Barbara, CA, USA
fYear
2014
fDate
20-23 May 2014
Firstpage
245
Lastpage
248
Abstract
In this paper, we study electromigration (EM) reliability of signal lines. We propose a general model for current conversion from pulsed DC to steady DC based on the consistency of maximal atomic flux divergence. Both long and short lead lines with high frequency current are considered. The calculated effective steady DC agrees with the measured results. Our conversion scheme can be applied also to signal lines with complex current paths.
Keywords
DC-DC power convertors; electromigration; DC-DC current conversion; atomic flux divergence; current conversion scheme; signal line electromigration reliability; Atomic measurements; Current density; Electromigration; Mathematical model; Reliability; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International
Conference_Location
San Jose, CA
Print_ISBN
978-1-4799-5016-4
Type
conf
DOI
10.1109/IITC.2014.6831886
Filename
6831886
Link To Document