DocumentCode :
1542804
Title :
Detection of Defects in Wiring Networks Using Time Domain Reflectometry
Author :
Smail, Mostafa Kamel ; Pichon, Lionel ; Olivas, Marc ; Auzanneau, Fabrice ; Lambert, Marc
Author_Institution :
Lab. de Genie Electr. de Paris, Univ. Paris-Sud, Gif-sur-Yvette, France
Volume :
46
Issue :
8
fYear :
2010
Firstpage :
2998
Lastpage :
3001
Abstract :
A new technique is proposed to reconstruct faulty wiring networks from the time-domain reflectometry (TDR) response. The developed method is also for characterization of defects in the branches of the network. The direct problem (propagation along the cables) is modeled by RLCG circuit parameters computed by finite element method (FEM) and the finite-difference time domain (FDTD) method. Genetic algorithms (GAs) are used to solve the inverse problem. The proposed method allows to accurately locate wire faults. Some examples are presented to validate and illustrate the ability of this reconstruction method.
Keywords :
RLC circuits; fault location; finite difference time-domain analysis; finite element analysis; genetic algorithms; network analysis; time-domain reflectometry; RLCG circuit parameter; defect detection; faulty wiring network reconstruction; finite element method; finite-difference time domain method; genetic algorithm; time domain reflectometry; time-domain reflectometry response; Cables; Circuit faults; Finite difference methods; Finite element methods; Genetic algorithms; Inverse problems; Reflectometry; Time domain analysis; Wire; Wiring; Genetic algorithms (GAs); multiconductor transmission lines; network fault diagnosis; time domain reflectometry (TDR);
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2010.2043720
Filename :
5512859
Link To Document :
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