Detection of Defects in Wiring Networks Using Time Domain Reflectometry

Author

Smail, Mostafa Kamel ; Pichon, Lionel ; Olivas, Marc ; Auzanneau, Fabrice ; Lambert, Marc

Author_Institution

Lab. de Genie Electr. de Paris, Univ. Paris-Sud, Gif-sur-Yvette, France

Volume

46

Issue

8

fYear

2010

Firstpage

2998

Lastpage

3001

Abstract

A new technique is proposed to reconstruct faulty wiring networks from the time-domain reflectometry (TDR) response. The developed method is also for characterization of defects in the branches of the network. The direct problem (propagation along the cables) is modeled by RLCG circuit parameters computed by finite element method (FEM) and the finite-difference time domain (FDTD) method. Genetic algorithms (GAs) are used to solve the inverse problem. The proposed method allows to accurately locate wire faults. Some examples are presented to validate and illustrate the ability of this reconstruction method.

Keywords

RLC circuits; fault location; finite difference time-domain analysis; finite element analysis; genetic algorithms; network analysis; time-domain reflectometry; RLCG circuit parameter; defect detection; faulty wiring network reconstruction; finite element method; finite-difference time domain method; genetic algorithm; time domain reflectometry; time-domain reflectometry response; Cables; Circuit faults; Finite difference methods; Finite element methods; Genetic algorithms; Inverse problems; Reflectometry; Time domain analysis; Wire; Wiring; Genetic algorithms (GAs); multiconductor transmission lines; network fault diagnosis; time domain reflectometry (TDR);

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2010.2043720

Filename

5512859