DocumentCode :
1542907
Title :
An abuttable CCD imager for visible and X-ray focal plane arrays
Author :
Burke, Barry E. ; Mountain, Robert W. ; Harrison, David C. ; Bautz, Marshall W. ; Doty, John P. ; Ricker, George R. ; Daniels, Peter J.
Author_Institution :
MIT Lincoln Lab., Lexington, MA, USA
Volume :
38
Issue :
5
fYear :
1991
fDate :
5/1/1991 12:00:00 AM
Firstpage :
1069
Lastpage :
1076
Abstract :
A frame-transfer silicon charge-coupled-device (CCD) imager has been developed that can be closely abutted to other imagers on three sides of the imaging array. It is intended for use in multichip arrays. The device has 420×420 pixels in the imaging and frame-store regions and is constructed using a three-phase triple-polysilicon process. Particular emphasis has been placed on achieving low-noise charge detection for low-light-level imaging in the visible and maximum energy resolution for X-ray spectroscopic applications. Noise levels of 6 electrons at 1-MHz and less than 3 electrons at 100-kHz data rates have been achieved. Imagers have been fabricated on 1000-Ω cm material to maximize quantum efficiency and minimize split events in the soft X-ray regime
Keywords :
CCD image sensors; X-ray detection and measurement; X-ray spectrometers; 1 MHz; 100 kHz; 1000 ohmcm; 176400 pixel; 420 pixel; Si; X-ray focal plane arrays; abuttable CCD imager; data rates; energy resolution for X-ray; frame-store regions; frame-transfer; low-light-level imaging; low-noise charge detection; minimize split events; multichip arrays; noise levels; quantum efficiency; soft X-ray regime; three-phase triple-polysilicon process; visible light focal plane arrays; Charge coupled devices; Electrons; Energy resolution; Optical imaging; Pixel; Silicon; Spectroscopy; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.78381
Filename :
78381
Link To Document :
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