Title :
A fully integrated 16-channel RSFQ autocorrelator operating at 11 GHz
Author :
Rylyakov, A.V. ; Schneider, D.F. ; Polyakov, Yu.A.
Author_Institution :
Dept. of Phys. & Astron., State Univ. of New York, Stony Brook, NY, USA
fDate :
6/1/1999 12:00:00 AM
Abstract :
We present the results of low- and high-speed testing of a fully integrated all-digital one-bit RSFQ autocorrelator for short-millimeter and submillimeter wave spectrometry applications. The 16-channel device, complete with a 16/spl times/9 array of binary counters, on-chip double-oversampling quantizer and on-chip clock was operational at clock speeds of up to 11 GHz. The total number of Josephson junctions in the design was 1672, while the estimated total power dissipation was less than 0.1 mW. For high-speed testing of the device we have developed a specialized 16-channel room-temperature interface capable of real-time data acquisition at a 16 Mbps-per-channel output rate. Extensive high-speed on-chip testing of the autocorrelator has also been performed, both in analog and digital modes, in the latter mode with an additional on-chip clock controller. All chips were fabricated in HYPRES´ standard 3.5 /spl mu/m-10 /spl mu/A//spl mu/m/sup 2/ Nb-trilayer process. We also present a new concept of a 128-channel autocorrelator system built on 8 independent identical chips with approximately 2,500 Josephson junctions per chip, i.e. within the reach of the present-day fabrication technology.
Keywords :
correlators; superconducting integrated circuits; 0.1 mW; 11 GHz; 16 Mbit/s; Josephson junction; Nb; Nb trilayer process; binary counter; chip interface; clock controller; data acquisition; double-oversampling quantizer; fully integrated all-digital multichannel RSFQ autocorrelator; high-speed testing; low-speed testing; millimeter wave spectrometry; power dissipation; submillimeter wave spectrometry; Autocorrelation; Clocks; Counting circuits; Data acquisition; Josephson junctions; Performance evaluation; Power dissipation; Spectroscopy; Submillimeter wave devices; Testing;
Journal_Title :
Applied Superconductivity, IEEE Transactions on