Comparative study of electron and laser beam scanning for local electrical characterization of high-T/sub c/ thin films and junctions

Author

Shadrin, P.M. ; Divin, Y.Y. ; Keil, S. ; Martin, J. ; Huebener, R.P.

Author_Institution

Inst. of Radioeng. & Electron. of RAS, Moscow, Russia

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

3925

Lastpage

3928

Abstract

The development of spatially resolved methods for an electrical characterization of thin films and junctions is essential for further progress in physics and applications of high-temperature superconductors. Two methods, electron beam and laser beam scanning, are used to get the high-resolution electrical images. In this paper we present the results of the comparison of electron- and laser-induced responses of the same high-T/sub c/ Josephson junctions. Using a laser-beam-induced thermoelectric response at room temperature and its odd-symmetric behavior across the grain boundaries, we were able to visualize the grain boundary faceting in bicrystal high-T/sub c/ Josephson junctions with the resolution of /spl sim/0.1 /spl mu/m.

Keywords

Josephson effect; bicrystals; grain boundaries; high-temperature superconductors; superconducting thin films; Josephson junction; bicrystal; electrical characteristics; electron beam scanning; grain boundary; high temperature superconductor; laser beam scanning; thermoelectric imaging; thin film; Electron beams; Grain boundaries; High temperature superconductors; Josephson junctions; Laser beams; Laser theory; Physics; Spatial resolution; Superconducting thin films; Thermoelectricity;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.783886

Filename

783886