DocumentCode :
1543648
Title :
High-resolution measurement by a high-T/sub c/ superconductor sampler
Author :
Hidaka, M. ; Satoh, T. ; Koike, M. ; Tahara, S.
Author_Institution :
Fundamental Res. Labs., NEC Corp., Ibaraki, Japan
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
4081
Lastpage :
4086
Abstract :
We measured a signal current waveform by using a high-T/sub c/ superconductor (HTS) sampler with a 1-ps delay between every sampling point. The maximum time differential obtained in the measured waveform was 12 /spl mu/A/ps with a 2.5-/spl mu/A current sensitivity at 25 K. This result guarantees that the sampler is able to measure current waveforms correctly when their maximum time differential is less than 12 /spl mu/A/ps. The superior temporal response was achieved by using high-speed single-flux-quantum pulses generated in the HTS circuit. A unique feature of the sampler is that it directly measures the current with picosecond and microampere resolutions. Measurement of current flowing through wiring in a semiconductor large-scale integrated circuits is a promising application for the HTS sampler.
Keywords :
electric current measurement; electric sensing devices; high-temperature superconductors; integrated circuit measurement; signal sampling; superconducting integrated circuits; wave analysers; 1 ps; 25 K; HTSC sampler; Josephson junctions; LSI wiring current measurement; critical current uniformity; current sensitivity; high temporal response; high-resolution measurement; high-speed single-flux-quantum pulses; maximum time differential; microampere resolution; picosecond resolution; ramp-edge junctions; signal current waveform measurement; superconducting loops; upper layer groundplane; Current measurement; High temperature superconductors; Integrated circuit measurements; Large scale integration; Propagation delay; Pulse circuits; Pulse generation; Sampling methods; Time measurement; Wiring;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.783923
Filename :
783923
Link To Document :
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