Title :
Mesh Refinement in Eddy Current Testing With Separated T-R Probes
Author :
Choua, Yahya ; Santandréa, Laurent ; Le Bihan, Yann ; Marchand, Claude
Author_Institution :
Lab. de Genie Electr. de Paris, UPMC Univ. Paris-Sud, Gif-sur-Yvette, France
Abstract :
In this paper we are interested in FEM mesh refinement procedure in ECT problems with separated T-R (Transmitter and Receiver probes) probes. Local error estimators used for a posteriori h-type mesh refinement are presented. They are based on the complementarity of the E and H formulations. A new estimator is proposed combining the solutions obtained by feeding alternatively the transmitter and the receiver. This estimator proves to be very accurate compared to classical ones.
Keywords :
eddy current testing; mesh generation; FEM mesh refinement; T-R probes; eddy current testing; local error estimators; posteriori h-type mesh refinement; Adaptive mesh refinement; Coils; Context modeling; Eddy current testing; Electrical capacitance tomography; Finite element methods; Inspection; Materials testing; Probes; Transmitters; Adaptive mesh refinement; Eddy current testing; finite element method; separated T-R probes; thin cracks;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2010.2045488