DocumentCode
1543677
Title
Mesh Refinement in Eddy Current Testing With Separated T-R Probes
Author
Choua, Yahya ; Santandréa, Laurent ; Le Bihan, Yann ; Marchand, Claude
Author_Institution
Lab. de Genie Electr. de Paris, UPMC Univ. Paris-Sud, Gif-sur-Yvette, France
Volume
46
Issue
8
fYear
2010
Firstpage
2795
Lastpage
2798
Abstract
In this paper we are interested in FEM mesh refinement procedure in ECT problems with separated T-R (Transmitter and Receiver probes) probes. Local error estimators used for a posteriori h-type mesh refinement are presented. They are based on the complementarity of the E and H formulations. A new estimator is proposed combining the solutions obtained by feeding alternatively the transmitter and the receiver. This estimator proves to be very accurate compared to classical ones.
Keywords
eddy current testing; mesh generation; FEM mesh refinement; T-R probes; eddy current testing; local error estimators; posteriori h-type mesh refinement; Adaptive mesh refinement; Coils; Context modeling; Eddy current testing; Electrical capacitance tomography; Finite element methods; Inspection; Materials testing; Probes; Transmitters; Adaptive mesh refinement; Eddy current testing; finite element method; separated T-R probes; thin cracks;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2010.2045488
Filename
5513009
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