Superconducting material diagnostics using a scanning near-field microwave microscope

Author

Anlage, S.M. ; Steinhauer, D.E. ; Vlahacos, C.P. ; Feenstra, B.J. ; Thanawalla, A.S. ; Wensheng Hu ; Dutta, S.K. ; Wellstood, F.C.

Author_Institution

Dept. of Phys., Maryland Univ., College Park, MD, USA

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

4127

Lastpage

4132

Abstract

We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 /spl mu/m. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of T/sub c/ of a YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities.

Keywords

barium compounds; high-temperature superconductors; microwave materials; microwave measurement; niobium; scanning probe microscopy; superconducting thin films; surface topography measurement; type II superconductors; yttrium compounds; Nb; YBa/sub 2/Cu/sub 3/O/sub 7/; electrodynamic properties; high-temperature superconductors; quantitative imaging; scanning near-field microwave microscope; sheet resistance; spatially resolved measurements; superconducting material diagnostics; surface topography; Electrodynamics; Microscopy; Microwave imaging; Niobium; Spatial resolution; Superconducting materials; Superconducting thin films; Surface resistance; Surface topography; Transistors;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.783934

Filename

783934