Title :
1 volt DC programmable Josephson voltage standard
Author :
Burroughs, C.J. ; Bent, S.P. ; Harvey, T.E. ; Hamilton, C.A.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
6/1/1999 12:00:00 AM
Abstract :
NIST has developed a programmable Josephson voltage standard (JVS) that produces intrinsically stable voltages that are programmable from -1.1 V to +1.1 V. The rapid settling time (1 /spl mu/s), large operating current margins (2 to 4 mA), and inherent step stability of this new system make it superior to a conventional JVS for many dc measurements. This improved performance is made possible by a new integrated-circuit technology using intrinsically shunted superconductor-normal-superconductor (SNS) Josephson junctions. These junctions operate at lower excitation frequencies (10 to 20 GHz) than a conventional JVS and have 100 times greater noise immunity. The Josephson chip consists of a binary array sequence of 32 768 SNS Josephson junctions. The chip has been integrated into a completely automated system that is finding application in mechanical/electrical watt-balance experiments, evaluation of thermal voltage converters, electron-counting capacitance standards, and metrology triangle experiments.
Keywords :
Josephson effect; measurement standards; programmable circuits; superconducting arrays; superconducting integrated circuits; superconductor-normal-superconductor devices; voltage measurement; 1 V; DC metrology; DC programmable Josephson voltage standard; Josephson chip; SNS Josephson junction; automated system; binary array; integrated circuit technology; Current measurement; Josephson junctions; Measurement standards; NIST; Semiconductor device measurement; Stability; Standards development; Superconducting device noise; Time measurement; Voltage;
Journal_Title :
Applied Superconductivity, IEEE Transactions on