Title :
´Functional abstraction´ anticipates timing glitches
Author :
Lathrop, Richard H. ; Hall, Robert J. ; Duff, Gavan ; Alexander, K.M. ; Kirk, Robert S.
Author_Institution :
Artificial Intelligence Lab., MIT, Cambridge, MA, USA
fDate :
4/1/1990 12:00:00 AM
Abstract :
The use of an algebraic alternative simulation called functional abstraction to determine whether processing variations will affect a chip´s timing is discussed. Functional abstraction involves constructing a functional model for a digital IC design from its structural model, or schematic. It allows chip manufacturing sensitivities to be identified more quickly and accurately than with simulation.<>
Keywords :
digital integrated circuits; integrated circuit manufacture; algebraic alternative simulation; chip manufacturing sensitivities; chip timing; digital IC design; functional abstraction; Application specific integrated circuits; CMOS technology; Chemicals; Digital integrated circuits; Equations; Integrated circuit modeling; Propagation delay; Testing; Timing; Virtual manufacturing;
Journal_Title :
Spectrum, IEEE
