DocumentCode :
1543789
Title :
Reduction of low frequency excess noise and temperature drift of SQUIDs by "degaussing" using high frequency magnetic fields
Author :
Muck, M. ; Schone, S. ; Heiden, C.
Author_Institution :
Inst. of Appl. Phys., Giessen Univ., Germany
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
3263
Lastpage :
3266
Abstract :
We have investigated a possible scheme to reduce 1/f noise generated by thermally activated hopping of vortices in SQUIDs by trying to remove vortices from the SQUID body, or at least move them to pinning sites having a high pinning energy. This is accomplished by a "demagnetisation" scheme using a high frequency magnetic field. Niobium SQUIDs were carefully cooled in a magnetically well shielded environment and then exposed to switching transients. The thereby generated low frequency excess noise or an increased white noise could substantially be reduced by this demagnetisation process. The temperature dependence of the flux signal of the flux locked SQUID and the magnetic field dependence of this drift could also be reduced in cases where the drift was caused by motion of trapped vortices. The influence of frequency and amplitude of the demagnetisation field on the amount of noise reduction was studied in some detail.
Keywords :
1/f noise; SQUIDs; demagnetisation; flux pinning; superconducting device noise; superconducting device testing; transients; white noise; 1/f noise reduction; Nb; SQUIDs; degaussing; demagnetisation scheme; flux locked SQUID; high frequency magnetic fields; high pinning energy; low frequency excess noise; magnetically well shielded environment; pinning sites; switching transients; temperature dependence; temperature drift; thermally activated vortex hopping; trapped vortex motion; white noise; Demagnetization; Frequency; Low-frequency noise; Magnetic noise; Magnetic shielding; Niobium; Noise generators; Noise reduction; SQUIDs; Temperature;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.622045
Filename :
622045
Link To Document :
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