• DocumentCode
    1543928
  • Title

    Charge transfer in 1-D HTS mesoscopic tunneling junction arrays

  • Author

    Tong, M.Z. ; Jiang, J.F. ; Cai, Q.Y.

  • Author_Institution
    Microelectron. Res. Center, Shanghai Jiaotong Univ., China
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    4269
  • Lastpage
    4272
  • Abstract
    The influence of superconducting energy gap on the performance of single electron transistor as electrometer has been studied and was found out to improve its charge sensitivity. This paper mainly deals with 1-D (dimensional) HTS mesoscopic tunneling junction array made up of HTS material Tl-1223 with capacitively coupling to a ground plan. The layered nature of Tl-1223 acts as ideal SIS junctions. The influence enforced by the superconducting energy gap on the static and dynamics of such an array is studied numerically based on the "Orthodox Theory" of single electronics. The charge transfer in the means of solitons introduced by the voltage source attached to the end of the array is also discussed.
  • Keywords
    barium compounds; calcium compounds; electrometers; high-temperature superconductors; mesoscopic systems; single electron transistors; solitons; superconducting arrays; superconducting energy gap; superconducting transistors; superconductive tunnelling; superconductor-insulator-superconductor devices; thallium compounds; SIS junction; Tl-1223 high temperature superconductor; TlBa/sub 2/Ca/sub 2/Cu/sub 3/O; capacitive coupling; charge sensitivity; charge transfer; electrometer; layered material; mesoscopic tunneling junction; one-dimensional array; orthodox theory; single electron transistor; soliton; superconducting energy gap; Charge transfer; High temperature superconductors; Josephson junctions; Single electron transistors; Solitons; Superconducting devices; Superconducting epitaxial layers; Superconducting materials; Tunneling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.783968
  • Filename
    783968