DocumentCode :
1544135
Title :
InGaAsP/InP optical switches embedded with semi-insulating InP current blocking layers
Author :
Wakao, Kiyohide ; Nakai, Kenya ; Kino, Masaru ; Yamakoshi, Shigenobu
Author_Institution :
Fujitsu Lab., Atsugi, Japan
Volume :
6
Issue :
7
fYear :
1988
fDate :
8/1/1988 12:00:00 AM
Firstpage :
1199
Lastpage :
1204
Abstract :
A carrier injection type of InGaAsP/InP optical switch is fabricated using a semi-insulating InP current blocking layer. The switching state is obtained by current injection of 180-1000 mA. The lifetime of the injection carrier is calculated to be 6.8 ns from the measurement of switching delay time. On the basis of these fundamental switching characteristics, the reduction of the operation current and the improvement of the modulation bandwidth are theoretically investigated. It is shown that the operation current as low as 3 mA will be attained for the switch with a 6° crossing angle and that high-speed operation up to 2 GHz will be achieved by increasing the doping level in the core layer. It is also shown that an optical switch with a crossing angle over 15° will be realized for this type of semiconductor switch
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; integrated optoelectronics; optical communication equipment; semiconductor doping; semiconductor switches; 180 to 1000 mA; 2 GHz; 6.8 ns; III-V semiconductors; InGaAsP-InP; InP; core layer; current injection; doping level; injection carrier lifetime; modulation bandwidth; optical switch; semi-insulating InP current blocking layers; switching delay time; High speed optical techniques; Indium phosphide; Insulation; Integrated optics; MOCVD; Monolithic integrated circuits; Optical crosstalk; Optical devices; Optical refraction; Optical switches;
fLanguage :
English
Journal_Title :
Selected Areas in Communications, IEEE Journal on
Publisher :
ieee
ISSN :
0733-8716
Type :
jour
DOI :
10.1109/49.7840
Filename :
7840
Link To Document :
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