DocumentCode
1544330
Title
A time-dependent charge-collection efficiency for diffusion
Author
Edmonds, Larry D.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume
48
Issue
5
fYear
2001
fDate
10/1/2001 12:00:00 AM
Firstpage
1609
Lastpage
1622
Abstract
The diffusion equation has some applications relevant to charge collection from ion tracks in silicon devices. Textbook solutions for the diffusion equation are available only for a few simple boundary geometries and special types of boundary conditions. A broader class of geometries was previously treated via a charge-collection efficiency function, but this applies only to total (integrated in time from zero to infinity) collected charge. The earlier work took advantage of the fact that Laplace´s equation can be solved for a broad class of geometries. This paper extends the earlier work so that it applies to charge collected up to an arbitrary time. A time-dependent charge-collection efficiency function can be estimated for any geometry such that Laplace´s equation has been solved. In particular, the analysis permits a comparison between diffusion calculations and a computer simulation of charge collection from an ion track. This comparison supports an earlier model in which charge collection, including a so-called “prompt” component, is driven by diffusion. The analysis applies to arbitrary track locations and directions. It also provides the option of treating a device geometry as two-dimensional in rectangular coordinates (if desired) while simultaneously treating the track as a line instead of a plane. Simulation codes having such flexibility regarding geometry are difficult to use, so the analysis makes the study of geometry effects accessible to a larger number of investigators
Keywords
carrier density; diffusion; electrical conductivity; semiconductor device models; Laplace equation; Si; Si devices; diffusion; ion track; prompt component; time-dependent charge-collection efficiency; Boundary conditions; Geometry; H infinity control; Laplace equations; Mathematical analysis; Mathematical model; NASA; Propulsion; Silicon devices; Space technology;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.960349
Filename
960349
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