Proximity effect and hot-electron diffusion in Ag/Al/sub 2/O/sub 3//Al tunnel junctions

Author

Netel, H. ; Jochum, J. ; Labov, S.E. ; Mears, C.A. ; Frank, M. ; Chow, D. ; Lindeman, M.A. ; Hiller, L.J.

Author_Institution

Phys. & Space Technol. Directorate, Lawrence Livermore Nat. Lab., CA, USA

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

3379

Lastpage

3382

Abstract

We have fabricated Ag/Al/sub 2/O/sub 3//Al tunnel junctions on Si substrates using a new process. This process was developed to fabricate superconducting tunnel junctions (STJs) on the surface of a superconductor. These junctions allow us to study the proximity effect of a superconducting Al film on a normal metal trapping layer. In addition, these devices allow us to measure the hot-electron diffusion constant using a single junction. Lastly these devices will help us optimize the design and fabrication of tunnel junctions on the surface of high-Z, ultra-pure superconducting crystals.

Keywords

Josephson effect; X-ray detection; alumina; aluminium; hot carriers; proximity effect (superconductivity); silver; superconducting device testing; superconducting junction devices; superconducting particle detectors; Ag-Al/sub 2/O/sub 3/-Al; Ag/Al/sub 2/O/sub 3//Al tunnel junctions; Si; Si substrates; cryogenic X-ray detection; high-Z ultra-pure superconducting crystal surface; hot-electron diffusion; normal metal trapping layer; proximity effect; superconducting tunnel junctions; tunnel junction fabrication; Artificial intelligence; Extraterrestrial measurements; Fabrication; Geophysical measurements; Josephson junctions; Photonic crystals; Proximity effect; Superconducting devices; Superconducting epitaxial layers; Superconducting films;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.622099

Filename

622099