Title :
Hilbert-transform spectral analysis of millimeter- and submillimeter-wave radiation with high T/sub c/ Josephson junctions
Author :
Divin, Y.Y. ; Pavlovskii, V.V. ; Volkov, O.Y. ; Schulz, H. ; Poppe, U. ; Klein, N. ; Urban, K.
Author_Institution :
Inst. of Radio Eng. & Electron., Acad. of Sci., Moscow, Russia
fDate :
6/1/1997 12:00:00 AM
Abstract :
We have demonstrated the first applications of Josephson-effect-based Hilbert-transform spectral analysis using high-T/sub c/ Josephson junctions. YBa/sub 2/Cu/sub 3/O/sub 7-x/ grain-boundary Josephson junctions have been fabricated on [110] NdGaO/sub 3/ bicrystal substrates for these measurements. At first, spectra of Josephson radiation have been measured by the Hilbert-transform technique in the range 60-800 GHz. A Lorentzian shape of the Josephson radiation and the possibility to obtain a spectral resolution as low as 0.1 cm/sup -1/ in the submillimeter-wave range has been demonstrated at liquid nitrogen temperature. Moreover, spectra of high-harmonic content of the radiation coming from commercial millimeter-wave oscillators have been measured in the spectral range from 60 to 450 GHz. A comparison of Hilbert-transform spectral analysis with conventional techniques is given.
Keywords :
Hilbert transforms; Josephson effect; barium compounds; high-temperature superconductors; millimetre wave spectra; spectral analysis; submillimetre wave spectra; superconducting device testing; superconducting junction devices; superconducting microwave devices; yttrium compounds; 60 to 800 GHz; Hilbert-transform spectral analysis; Lorentzian shape; NdGaO/sub 3/; YBa/sub 2/Cu/sub 3/O/sub 7-x/ grain-boundary Josephson junctions; YBa/sub 2/Cu/sub 3/O/sub 7/; [110] NdGaO/sub 3/ bicrystal substrates; high T/sub c/ Josephson junctions; high-harmonic content; millimeter-wave oscillators; millimeter-wave radiation; spectral resolution; submillimeter-wave radiation; Electromagnetic measurements; Electromagnetic radiation; High temperature superconductors; Josephson junctions; Millimeter wave measurements; Shape; Spectral analysis; Spectroscopy; Voltage; Wavelength measurement;
Journal_Title :
Applied Superconductivity, IEEE Transactions on