DocumentCode :
1544916
Title :
ErrorTracer: design error diagnosis based on fault simulation techniques
Author :
Huang, Shi-Yu ; Cheng, Kwang-Ting
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume :
18
Issue :
9
fYear :
1999
fDate :
9/1/1999 12:00:00 AM
Firstpage :
1341
Lastpage :
1352
Abstract :
This paper addresses the problem of locating error sources in an erroneous combinational or sequential circuit. We use a fault simulation-based technique to approximate each internal signal´s correcting power. The correcting power of a particular signal is measured in terms of the signal´s correctable set, namely, the maximum set of erroneous input vectors or sequences that can be corrected by resynthesizing the signal. Only the signals that can correct every given erroneous input vector or sequence are considered as a potential error source. Our algorithm offers three major advantages over existing methods. First, unlike symbolic approaches, it is applicable for large circuits. Second, it delivers more accurate results than other simulation-based approaches because it is based on a more stringent condition for identifying potential error sources. Third, it can be generalized to identify multiple errors theoretically. Experimental results on diagnosing combinational and sequential circuits with one and two random errors are presented to show the effectiveness and efficiency of this new approach
Keywords :
VLSI; combinational circuits; fault simulation; integrated circuit design; integrated circuit testing; logic CAD; logic testing; sequential circuits; ErrorTracer; VLSI design; combinational circuit; complexity; design automation; design error diagnosis; erroneous input vectors; error correction; fault simulation techniques; internal signal correcting power; large circuits; maximum set; multiple errors; random errors; sequential circuit; Circuit faults; Circuit simulation; Combinational circuits; Computer errors; Error correction; Fault diagnosis; Particle measurements; Power measurement; Process design; Sequential circuits;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.784125
Filename :
784125
Link To Document :
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