DocumentCode :
1544929
Title :
Highly accurate and simple models for CML and ECL gates
Author :
Alioto, M. ; Palumbo, G.
Author_Institution :
Dipt. di Elettrico, Elettronico e Sistemistco, Catania Univ., Italy
Volume :
18
Issue :
9
fYear :
1999
fDate :
9/1/1999 12:00:00 AM
Firstpage :
1369
Lastpage :
1375
Abstract :
In this paper simple and accurate models for the propagation delay of both current mode logic (CML) and emitter-coupled logic (ECL) gates are proposed. The models start from the small signal model properly evaluated. This makes it possible to represent propagation delay with a few terms, providing a better insight into the relationship between delay and its electrical parameters, which in turn are related to process parameters. The main difference between accurate and simple models is that the former need few Spice simulations to properly evaluate the model parameters. In order to validate the models, a comparison using both a traditional and a high-speed bipolar process was carried out under many bias conditions and output loads. Simple models have typical errors of around 20%. Accurate models have typical errors as low as 2% and 5% for CML and ECL, respectively, while the worst case error is as low as 5% and 8% for CML and ECL, respectively
Keywords :
bipolar logic circuits; circuit simulation; current-mode logic; delay estimation; emitter-coupled logic; high-speed integrated circuits; integrated circuit modelling; CML gates; ECL gates; bias conditions; current mode logic; emitter-coupled logic; high-speed bipolar process; output loads; process parameters; propagation delay; small signal model; Bipolar transistor circuits; Delay estimation; Digital integrated circuits; High speed integrated circuits; Integrated circuit modeling; Load modeling; Logic circuits; Logic gates; Propagation delay; Sensitivity analysis;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.784127
Filename :
784127
Link To Document :
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