DocumentCode
1544954
Title
Fabrication of superconductor/semiconductor quasi-monolithic devices using epitaxial liftoff technology
Author
Qixin Huang ; Hohkawa, K.
Author_Institution
Dept. of Electron. & Electr. Eng., Kanagawa Inst. of Technol., Japan
Volume
7
Issue
2
fYear
1997
fDate
6/1/1997 12:00:00 AM
Firstpage
3461
Lastpage
3464
Abstract
This paper reports a study on the fabrication technology of high performance functional devices, where high temperature superconductor and compound semiconductor devices are monolithically integrated on the same substrate. We investigated optimal conditions for epitaxial liftoff process and succeeded in fabricating HTS device and GaAs MESFET on SrTiO/sub 3/ substrate without degrading characteristics of superconductor and semiconductor devices. We also carried out basic integrated circuit fabrication processes such as patterning and etching for quasi-monolithic structure. The results confirmed that fabricating high performance functional devices is feasible.
Keywords
III-V semiconductors; Schottky gate field effect transistors; electron device manufacture; gallium arsenide; high-temperature superconductors; semiconductor epitaxial layers; semiconductor technology; superconducting junction devices; superconductor-semiconductor boundaries; GaAs; GaAs MESFET; SrTiO/sub 3/; SrTiO/sub 3/ substrate; compound semiconductor; epitaxial liftoff technology; etching; high temperature superconductor; integrated circuit fabrication; patterning; superconductor/semiconductor quasi-monolithic device; Degradation; Fabrication; Gallium arsenide; High temperature superconductors; MESFETs; Semiconductor devices; Substrates; Superconducting devices; Superconducting epitaxial layers; Superconducting integrated circuits;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.622135
Filename
622135
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