DocumentCode
1545000
Title
Anomalous current-dependence of kinetic inductance in ultrathin NbN meander lines
Author
Johnson, M.W. ; Kadin, A.M.
Author_Institution
Dept. of Phys. & Astron., Rochester Univ., NY, USA
Volume
7
Issue
2
fYear
1997
fDate
6/1/1997 12:00:00 AM
Firstpage
3492
Lastpage
3495
Abstract
We have measured the rf impedance of 10-nm thick superconducting granular NbN meander lines between 5 /spl mu/m and 20 /spl mu/m wide. The complex reflection coefficient was obtained directly using a vector network analyzer. The impedance (at 10 MHz for a 5 /spl mu/m wide line) is dominated by the large kinetic Inductance of the film, with a sheet inductance of order 1 nH, giving a total inductance of 400 nH for a 5 /spl mu/m/spl times/2 mm line. The kinetic inductance diverges as T/spl rarr/T/sub c/=6.5 K, as expected from Ginzburg-Landau theory (GL). Of particular interest is a substantial decrease of measured inductance with increasing dc current, contrary to the dependence expected from GL. This anomalous current dependence is not well understood, but may be related to vortex dynamics and Josephson effects in these granular films, as supported by preliminary Josephson array simulations. These results have important implications for potential devices such as tunable rf phase shifters and kinetic inductance photodetectors.
Keywords
Ginzburg-Landau theory; Josephson effect; flux flow; inductance; network analysers; niobium compounds; reflectometry; superconducting device testing; superconducting microwave devices; superconducting thin films; 10 MHz; 10 nm; 150 MHz; 5 to 20 micron; Ginzburg-Landau theory; Josephson array simulations; Josephson effects; NbN; RF impedance; complex reflection coefficient; kinetic inductance; microwave devices; photodetectors; sheet inductance; superconducting thin films; tunable phase shifters; ultrathin meander lines; vector network analyzer; vortex dynamics; Current measurement; Granular superconductors; Impedance measurement; Inductance; Kinetic theory; Optical films; Reflection; Superconducting films; Superconducting photodetectors; Thickness measurement;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.622146
Filename
622146
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