• DocumentCode
    1545088
  • Title

    A Marked Point Process for Modeling Lidar Waveforms

  • Author

    Mallet, Clément ; Lafarge, Florent ; Roux, Michel ; Soergel, Uwe ; Bretar, Frédéric ; Heipke, Christian

  • Author_Institution
    Lab. MATIS, Univ. Paris-Est, St. Mande, France
  • Volume
    19
  • Issue
    12
  • fYear
    2010
  • Firstpage
    3204
  • Lastpage
    3221
  • Abstract
    Lidar waveforms are 1-D signals representing a train of echoes caused by reflections at different targets. Modeling these echoes with the appropriate parametric function is useful to retrieve information about the physical characteristics of the targets. This paper presents a new probabilistic model based upon a marked point process which reconstructs the echoes from recorded discrete waveforms as a sequence ofparametric curves. Such an approach allows to fit each mode of a waveform with the most suitable function and to deal with both, symmetric and asymmetric, echoes. The model takes into account a data term, which measures the coherence between the models and the waveforms, and a regularization term, which introduces prior knowledge on the reconstructed signal. The exploration of the associated configuration space is performed by a reversible jump Markov chain Monte Carlo (RJMCMC) sampler coupled with simulated annealing. Experiments with different kinds of lidar signals, especially from urban scenes, show the high potential of the proposed approach. To further demonstrate the advantages of the suggested method, actual laser scans are classified and the results are reported.
  • Keywords
    Markov processes; Monte Carlo methods; optical radar; radar signal processing; signal representation; simulated annealing; actual laser scans; lidar waveforms; marked point process; parametric curves; parametric function; recorded discrete waveforms; reversible jump Markov chain Monte Carlo sampler; simulated annealing; Automation; Clustering algorithms; Image segmentation; Laboratories; Laser radar; Lattices; Multidimensional systems; Object recognition; Pattern recognition; Vectors; Lidar; Monte Carlo sampling; marked point process; object-based stochastic model; source modeling; Image Enhancement; Image Processing, Computer-Assisted; Markov Chains; Models, Statistical; Monte Carlo Method;
  • fLanguage
    English
  • Journal_Title
    Image Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7149
  • Type

    jour

  • DOI
    10.1109/TIP.2010.2052825
  • Filename
    5518410