DocumentCode
1545088
Title
A Marked Point Process for Modeling Lidar Waveforms
Author
Mallet, Clément ; Lafarge, Florent ; Roux, Michel ; Soergel, Uwe ; Bretar, Frédéric ; Heipke, Christian
Author_Institution
Lab. MATIS, Univ. Paris-Est, St. Mande, France
Volume
19
Issue
12
fYear
2010
Firstpage
3204
Lastpage
3221
Abstract
Lidar waveforms are 1-D signals representing a train of echoes caused by reflections at different targets. Modeling these echoes with the appropriate parametric function is useful to retrieve information about the physical characteristics of the targets. This paper presents a new probabilistic model based upon a marked point process which reconstructs the echoes from recorded discrete waveforms as a sequence ofparametric curves. Such an approach allows to fit each mode of a waveform with the most suitable function and to deal with both, symmetric and asymmetric, echoes. The model takes into account a data term, which measures the coherence between the models and the waveforms, and a regularization term, which introduces prior knowledge on the reconstructed signal. The exploration of the associated configuration space is performed by a reversible jump Markov chain Monte Carlo (RJMCMC) sampler coupled with simulated annealing. Experiments with different kinds of lidar signals, especially from urban scenes, show the high potential of the proposed approach. To further demonstrate the advantages of the suggested method, actual laser scans are classified and the results are reported.
Keywords
Markov processes; Monte Carlo methods; optical radar; radar signal processing; signal representation; simulated annealing; actual laser scans; lidar waveforms; marked point process; parametric curves; parametric function; recorded discrete waveforms; reversible jump Markov chain Monte Carlo sampler; simulated annealing; Automation; Clustering algorithms; Image segmentation; Laboratories; Laser radar; Lattices; Multidimensional systems; Object recognition; Pattern recognition; Vectors; Lidar; Monte Carlo sampling; marked point process; object-based stochastic model; source modeling; Image Enhancement; Image Processing, Computer-Assisted; Markov Chains; Models, Statistical; Monte Carlo Method;
fLanguage
English
Journal_Title
Image Processing, IEEE Transactions on
Publisher
ieee
ISSN
1057-7149
Type
jour
DOI
10.1109/TIP.2010.2052825
Filename
5518410
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