DocumentCode :
1545110
Title :
Current dependent noise in a YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// hot-electron bolometer
Author :
Gousev, Yu.P. ; Semenov, A.D. ; Goghidze, I.G. ; Pechen, E.V. ; Varlashkin, A.V. ; Gol´tsman, G.N. ; Gershenzon, E.M. ; Renk, K.F.
Author_Institution :
Inst. fur Angewandte Phys., Regensburg Univ., Germany
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
3556
Lastpage :
3559
Abstract :
We investigated the output noise of a YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) superconducting hot-electron bolometer (HEB) in a large frequency range (10 kHz to 8 GHz); the bolometer either consisted of a structured 50 nm thick YBCO film on LaAlO/sub 3/ or a 30 nm thick film on a MgO substrate. We found that flicker noise dominated at low frequencies (below 1 MHz), while at higher frequencies Johnson noise and a current dependent noise were the main noise sources.
Keywords :
barium compounds; bolometers; flicker noise; high-temperature superconductors; hot carriers; submillimetre wave mixers; superconducting device noise; superconducting device testing; superconducting microbridges; thermal noise; yttrium compounds; 10 kHz to 8 GHz; 30 nm; 50 nm; Johnson noise; LaAlO/sub 3/; LaAlO/sub 3/ substrate; MgO; MgO substrate; YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// hot-electron bolometer; YBa/sub 2/Cu/sub 3/O/sub 7/; current dependent noise; flicker noise; microbridges; mixer; output noise; structured film; superconducting hot-electron bolometer; Bolometers; Current-voltage characteristics; Electrical resistance measurement; Equations; Frequency conversion; Impedance; Noise level; Noise measurement; Temperature dependence; Voltage;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.622166
Filename :
622166
Link To Document :
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