• DocumentCode
    1545138
  • Title

    Influence of DX centers on the performance of unipolar semiconductor lasers based on GaAs-Al/sub x/Ga/sub 1-x/As

  • Author

    Sirtori, Carlo ; Barbieri, Stefano ; Kruck, Peter ; Piazza, Vincenzo ; Beck, Mattias ; Faist, Jéerôme ; Oesterle, Ursula ; Collot, Philippe ; Nagle, Julien

  • Author_Institution
    Lab. Central de Recherches, Thomson-CSF, Orsay, France
  • Volume
    11
  • Issue
    9
  • fYear
    1999
  • Firstpage
    1090
  • Lastpage
    1092
  • Abstract
    Optical and electrical characteristics of quantum cascade lasers, made in the GaAs-Al/sub x/Ga/sub 1-x/As material system, show persistent changes at low temperatures, when devices are illuminated with an external white light. The magnitude of the effect is a function of the exposure time and finally saturates. The induced variation on the threshold current density of the lasers is more than 30%. This effect is related to the presence of deep donors (DX centers) in the high aluminum content AlGaAs cladding layers, which under illumination release electrons, thus increasing waveguide losses. By analyzing the light induced variations of the optical characteristics we were able to deduce the waveguide losses of our devices.
  • Keywords
    III-V semiconductors; aluminium compounds; deep levels; electron traps; gallium arsenide; laser beams; optical losses; semiconductor lasers; waveguide lasers; AlGaAs cladding layers; DX centers; GaAs-Al/sub x/Ga/sub 1-x/As laser; GaAs-AlGaAs; deep donors; electrical characteristics; electron release; exposure time; external white light; illumination; light induced variations; optical characteristics; quantum cascade lasers; threshold current density; unipolar semiconductor lasers; waveguide losses; Electric variables; Optical devices; Optical losses; Optical materials; Optical saturation; Optical waveguides; Quantum cascade lasers; Temperature; Threshold current; Waveguide lasers;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.784160
  • Filename
    784160