• DocumentCode
    1545211
  • Title

    SFQ balanced comparators at a finite sampling rate

  • Author

    Semenov, V.K. ; Filippov, T.V. ; Polyakov, Yu.A. ; Likharev, K.K.

  • Author_Institution
    Dept. of Phys., State Univ. of New York, Stony Brook, NY, USA
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    3617
  • Lastpage
    3621
  • Abstract
    We have extended our previous study of SFQ balanced comparators which use two overdamped Josephson junctions to (a) finite sampling rate and (b) junctions with higher critical current density. The effective width /spl Delta/I/sub x/ of the gray zone of the comparators fabricated using the niobium-trilayer technology of HYPRES, Inc. (j/sub c//spl ap/1 kA/cm/sup 2/) and Stony Brook\´s domestic planarized process (j/sub c//spl ap/5 kA/cm/sup 2/) has been measured as a function of the SFQ pulse rate (from 2.5 to 55 GHz) and temperature (from 1.6 to 4.2 K), for various drivers which determine the SFQ pulse shape and external impedance. The data have been compared with available theories of Josephson junction dynamics in the presence of thermal and quantum fluctuations. We have found that /spl Delta/I/sub x/ can be substantially reduced by using relatively broad ("soft") SFQ pulses. For high-j/sub c/ comparators fed by short (/spl sim/2-ps) SFQ pulses the temperature dependence is practically negligible, indicating the dominance of quantum fluctuations.
  • Keywords
    comparators (circuits); fluctuations in superconductors; superconducting junction devices; 1.6 to 4.2 K; 2 ps; 2.5 to 55 GHz; Nb; SFQ balanced comparator; critical current density; driver; dynamics; gray zone; niobium trilayer technology; overdamped Josephson junction; planarization; pulse rate; quantum fluctuations; sampling rate; thermal fluctuations; Critical current density; Fluctuations; Impedance measurement; Josephson junctions; Pulse measurements; Pulse shaping methods; Sampling methods; Shape measurement; Space vector pulse width modulation; Temperature;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.622189
  • Filename
    622189