• DocumentCode
    1545268
  • Title

    A Contact-Resistive Random-Access-Memory-Based True Random Number Generator

  • Author

    Huang, Chien-Yuan ; Shen, Wen Chao ; Tseng, Yuan-Heng ; King, Ya-Chin ; Lin, Chrong-Jung

  • Author_Institution
    Inst. of Electron. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • Volume
    33
  • Issue
    8
  • fYear
    2012
  • Firstpage
    1108
  • Lastpage
    1110
  • Abstract
    A new type of true random number generator, based on the random telegraph noise of a contact-resistive random access memory device, is proposed in this letter. The random-number generator consists of only a simple bias circuit plus a comparator, leading to small circuit area and low power consumption. By realizing this generator by the 65-nm complementary metal-oxide-semiconductor logic process, the occupied area can be as low as 45 μm2, demonstrating substantial saving in the circuit area.
  • Keywords
    CMOS memory circuits; random noise; random number generation; random-access storage; bias circuit; comparator; complementary metal-oxide-semiconductor logic process; contact-resistive random access memory device; low power consumption; random telegraph noise; size 65 nm; true random number generator; Electron traps; Encryption; Generators; Noise; Resistance; Voltage control; Contact-resistive random access memory (CRRAM); random telegraph noise (RTN); random-number generator;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2199734
  • Filename
    6221944