• DocumentCode
    1545475
  • Title

    Analysis of open-loop tanlock carrier recovery for BPSK

  • Author

    Kam, Pooi Yuen ; Cheong, Tek Mun

  • Author_Institution
    Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
  • Volume
    33
  • Issue
    6
  • fYear
    1997
  • fDate
    3/13/1997 12:00:00 AM
  • Firstpage
    443
  • Lastpage
    444
  • Abstract
    An approximate analysis valid for high SNR, is presented for the probability density function of the phase tracking error of the open-loop carrier recovery structure for BPSK proposed by Kam (see ibid., vol. 30, no. 23, p. 1923-4). The result is verified by computer simulations, and enables the evaluation of error probability of the tanlock structure
  • Keywords
    demodulation; error analysis; phase shift keying; probability; BPSK; approximate analysis; error probability evaluation; high SNR; open-loop tanlock carrier recovery; phase tracking error; probability density function;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19970326
  • Filename
    585026
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1545475