Title :
Point pattern matching by line segments and labels
Author :
Wang, Wen-Hao ; Chen, Yung-Chang
Author_Institution :
Inst. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fDate :
3/13/1997 12:00:00 AM
Abstract :
A point pattern matching method is proposed using the intrinsic invariant properties of a line segment which contains any two labelled points. Consequently, only the patterns which are judged to be affine-related are used to estimate the affine parameters so that efficient invariant image matching can be attained
Keywords :
image matching; pattern matching; affine parameters; invariant image matching; label; line segment; point pattern matching;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19970337
