DocumentCode

1545737

Title

Stupid statistics reliability prediction

Volume

48

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

105

Lastpage

105

Keywords

Arithmetic; Capacitors; Mathematics; Probability; Statistical analysis; Statistical distributions; Statistics; Testing; Uncertainty; Voltage;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/TR.1999.784264

Filename

784264