Title :
Testability analysis of analog systems
Author :
Hemink, Gertjan J. ; Meijer, Berend W. ; Kerkhoff, Hans G.
fDate :
6/1/1990 12:00:00 AM
Abstract :
A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present
Keywords :
analogue circuits; integrated circuit testing; linear integrated circuits; linear analog systems; nonlinear analog systems; rank-test algorithm; statistical methods; testability; Analog circuits; Circuit testing; Costs; Equations; Integrated circuit testing; Measurement errors; Measurement standards; Statistical analysis; System testing; Transmission line matrix methods;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
