• DocumentCode
    1545777
  • Title

    Analyzing accelerated degradation data by nonparametric regression

  • Author

    Shiau, Jyh-Jen Horng ; Lin, Hsin-Hua

  • Author_Institution
    Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    48
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    149
  • Lastpage
    158
  • Abstract
    This paper presents a nonparametric regression accelerated life-stress (NPRALS) model for accelerated degradation data wherein the data consist of groups of degrading curve data. In contrast to the usual parametric modeling, a nonparametric regression model relaxes assumptions on the form of the regression functions and lets data speak for themselves in searching for a suitable model for data. NPRALS assumes that various stress levels affect only the degradation rate, but not the shape of the degradation curve. An algorithm is presented for estimating the components of NPRALS. By investigating the relationship between the acceleration factors and the stress levels, the mean time to failure estimate of the product under the usual use condition is obtained. The procedure is applied to a set of data obtained from an accelerated degradation test for a light emitting diode product. The results look very promising. The performance of NPRALS is further checked by a simulated example and found satisfactory. We anticipate that NPRALS can be applied to other applications as well
  • Keywords
    failure analysis; life testing; light emitting diodes; nonparametric statistics; statistical analysis; accelerated degradation data analysis; acceleration factors; degrading curve data; light emitting diode product; local linear regression smoother; mean time to failure estimate; nonparametric regression; nonparametric regression accelerated life-stress model; regression functions; stochastic process; stress levels; Acceleration; Data analysis; Degradation; Ear; Life estimation; Life testing; Lifetime estimation; Light emitting diodes; Stochastic processes; Stress;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.784273
  • Filename
    784273