AFM analysis of step-edge Josephson junctions

Author

Bulman, J.B. ; Salazar, O.O. ; Murduck, J.M.

Author_Institution

Loyola Marymount Univ., Los Angeles, CA, USA

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

3650

Lastpage

3653

Abstract

We report on an analysis of step-edge Josephson junctions with a variety of different electrical behavior I/sub c/´s and IV curve characteristic shapes. We investigated a correlation between the shape of the IV curve and the morphology of the step-edge YBCO film concentrating on the sharpness of the step. Using Atomic Force Microscopy (AFM), determination of the film´s surface properties over the step were obtained. The steepness of the angle of the film over the step correlated with the behavior of the IV curve. When the average angle over the step was >23/spl deg/ the IV curve exhibited the resistively shunted junction [RSJ] shape. Less steep average angles <23/spl deg/ corresponded to flux flow-like IV curves.

Keywords

Josephson effect; atomic force microscopy; barium compounds; critical currents; flux flow; high-temperature superconductors; superconducting device testing; superconducting thin films; surface structure; yttrium compounds; AFM analysis; I-V curve characteristic shapes; YBa/sub 2/Cu/sub 3/O/sub 7/; YBaCuO; angle steepness; critical currents; film morphology; film surface properties; flux flow-like I-V curves; resistively shunted junction shape; step sharpness; step-edge Josephson junctions; Grain boundaries; Josephson junctions; Shape; Voltage; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.622209

Filename

622209