DocumentCode
1545942
Title
Comparison of effective noise temperatures in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// junctions
Author
Fischer, G.M. ; Mygind, J. ; Pedersen, N.F.
Author_Institution
Dept. of Phys., Tech. Univ., Lyngby, Denmark
Volume
7
Issue
2
fYear
1997
fDate
6/1/1997 12:00:00 AM
Firstpage
3654
Lastpage
3657
Abstract
The dc voltage response to 70 GHz radiation was measured for YBCO bicrystal junctions, step edge junctions and ramp edge junctions at temperatures from 4 K to 90 K. Employing the RSJ-model and assuming thermal noise, the Josephson radiation is about equal to the voltage difference of the voltage response to the small signal microwave irradiation. In the presence of excess noise, an effective noise temperature can be defined and is used as a figure of merit. In bicrystal grain boundary junctions with zero magnetic field the effective noise temperature was determined to be equal to the physical temperature within experimental error. Bicrystal grain boundary junctions with non-zero magnetic field, step edge junctions and ramp edge junctions showed excess noise. The scaling of the noise temperature is compared with the width of the junction in units of the Josephson penetration depth.
Keywords
Josephson effect; barium compounds; high-temperature superconductors; superconducting device noise; superconducting device testing; thermal noise; yttrium compounds; 4 to 90 K; 70 GHz; Josephson penetration depth; Josephson radiation; RSJ-model; YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// junctions; YBa/sub 2/Cu/sub 3/O/sub 7/; bicrystal grain boundary junctions; dc voltage response; effective noise temperature comparison; excess noise; figure of merit; noise temperature scaling; ramp edge junctions; small signal microwave irradiation; step edge junctions; thermal noise; Diodes; Frequency measurement; Integrated circuit noise; Josephson junctions; Noise figure; Noise shaping; Switches; Temperature; Virtual colonoscopy; Voltage;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.622210
Filename
622210
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