Scanning microwave microscopy of active superconducting microwave devices

Author

Anlage, S.M. ; Vlahacos, C.P. ; Dutta, S. ; Wellstood, F.C.

Author_Institution

Dept. of Phys., Maryland Univ., College Park, MD, USA

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

3686

Lastpage

3689

Abstract

We have developed a scanning microwave microscope which can image features with 20 /spl mu/m spatial resolution. The microscope consists of a section of open-ended coaxial cable which is scanned over the surface of a planar sample. Images can be made in either passive mode, in which the reflectivity of the probe tip is measured as a function of position, or in active mode, in which stray fields from the sample are picked up by the scanning probe and measured with a vector demodulation circuit. We have imaged reflectivity variations of metallic and superconducting samples in passive mode to determine the spatial resolution of the technique. Images are also presented in active mode of a superconducting microwave device taken at liquid nitrogen temperature.

Keywords

microstrip circuits; microstrip lines; microwave imaging; microwave reflectometry; superconducting microwave devices; 77 K; active mode; active superconducting microwave devices; metallic samples; microstrip circuits; microstrips; open-ended coaxial cable; passive mode; planar sample surface scanning; probe tip reflectivity; reflectivity variation imaging; scanning microwave microscopy; scanning probe; spatial resolution; stray fields; superconducting samples; vector demodulation circuit; Circuits; Coaxial cables; Demodulation; Microscopy; Position measurement; Probes; Reflectivity; Spatial resolution; Superconducting cables; Superconducting microwave devices;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.622218

Filename

622218