DocumentCode :
1546104
Title :
Directly coupled DC-SQUIDs of YBCO step-edge junctions fabricated by a chemical etching process operating at 77 K
Author :
Junho Gohng ; Eun-Hong Lee ; I-Hun Song ; Junghyun Sok ; Sang-Jin Park ; Jo-Won Lee ; Dosquet, C.Y.
Author_Institution :
Mater. & Devices Res. Center, Samsung Adv. Inst. of Technol., Suwon, South Korea
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
3694
Lastpage :
3697
Abstract :
High T/sub c/ directly coupled DC-SQUIDs have been successfully fabricated on chemically etched MgO substrate steps. The chemical etching was performed in a mixed acid solution of H/sub 3/PO/sub 4/ and H/sub 2/SO/sub 4/ for the best control of etched surface and roughness. YBCO thin films were deposited epitaxially on the step-edged MgO substrate by a KrF laser ablation method. Characteristics of the directly coupled DC-SQUID have been studied following the patterning and fabrication of the device. The chemically etched steps show sharper edges at the bottom of the step as well as the top unlike those made by ion milling. AFM and Raman Spectroscopy studies on the YBCO thin film deposited and patterned on chemically etched show no sign of appreciable degradation. The result is a good quality junction even at a relatively low step angle. Directly coupled DC-SQUIDs that are fabricated with this process show sweeping voltages of 160 /spl mu/V at 4.2 K, and 6 /spl mu/V at 77 K, respectively.
Keywords :
Josephson effect; SQUIDs; barium compounds; etching; high-temperature superconductors; yttrium compounds; 77 K; AFM; MgO substrate; Raman spectroscopy; YBCO step-edge junction; YBaCuO; chemical etching; directly coupled DC-SQUID; epitaxial thin film; fabrication; laser ablation; surface roughness; Chemical lasers; Etching; Laser ablation; Milling; Optical device fabrication; Rough surfaces; Sputtering; Substrates; Surface roughness; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.622220
Filename :
622220
Link To Document :
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