Title :
Contributions from the seventh topical meeting on electrical performance of electronic packaging
Author :
Deutsch, A. ; Swaminathan, Madhavan
Author_Institution :
IBM Corp.
fDate :
8/1/1999 12:00:00 AM
Keywords :
CMOS technology; Crosstalk; Electronics packaging; Millimeter wave measurements; Millimeter wave technology; NIST; Power distribution; Power system modeling; Power system simulation; Wiring;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.1999.784470