DocumentCode :
1546340
Title :
Accurate power supply and ground plane pair models [for MCMs]
Author :
Wu, Henry Hungjen ; Meyer, Jeffrey W. ; Lee, Keunmyung ; Barber, Alan
Author_Institution :
Hewlett-Packard Co., Santa Rosa, CA, USA
Volume :
22
Issue :
3
fYear :
1999
fDate :
8/1/1999 12:00:00 AM
Firstpage :
259
Lastpage :
266
Abstract :
In this paper, we derive a theory and method for the use of two-dimensional (2-D) discrete transmission lines (TL´s) or discrete coupled transmission lines (CTL´s) in modeling power supply and ground planes accurately. If the stray coupling between power or local ground and global ground is not significant, the discrete TL´s model is used. Otherwise the discrete CTL´s model is used. An arbitrarily shaped plane pair is discretized into a 2-D TL or CTL array by an automatic mesh algorithm. The equivalent distributed circuit, including skin loss effect at high frequencies, represents this power ground plane pair. The theory is extended to be applicable to a generic multiple dielectric layer structure. The model computation results are in excellent agreement with S parameter measurements for practical frequency ranges, including the first major resonant nulls and peaks. The null or peak of the S parameter frequency response represents the test port interaction with the resonant standing wave of these planes at that frequency. The resultant S parameter data of these models can be condensed into a simpler N port equivalent circuit to represent a larger hierarchical power and ground plane network for fast simulation
Keywords :
S-parameters; coupled transmission lines; equivalent circuits; frequency response; mesh generation; multichip modules; power supplies to apparatus; skin effect; MCMs; N port equivalent circuit; S parameter frequency response; S parameter measurements; arbitrarily shaped plane pair; automatic mesh algorithm; discrete coupled transmission lines; equivalent distributed circuit; generic multiple dielectric layer structure; ground planes; power supply planes; resonant nulls; resonant peaks; skin loss effect; stray coupling; test port interaction; two-dimensional discrete transmission lines; Coupling circuits; Dielectrics; Frequency; Power supplies; Power transmission lines; Resonance; Scattering parameters; Skin; Transmission line theory; Two dimensional displays;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/6040.784473
Filename :
784473
Link To Document :
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