• DocumentCode
    1546431
  • Title

    Evolution of a unique flip-chip MCM-L package

  • Author

    Jimarez, Miguel A. ; Tran, Son ; Le Coz, Christian ; Dearing, Glenn O.

  • Author_Institution
    IBM Microelectron., Endicott, NY, USA
  • Volume
    22
  • Issue
    3
  • fYear
    1999
  • fDate
    8/1/1999 12:00:00 AM
  • Firstpage
    372
  • Lastpage
    378
  • Abstract
    Flip-chip (FC) packaging is gaining acceptance in the electronics packaging arena. More sources of bumped die and high density printed wiring boards (PWBs) laminates become available every day. Also, known good die (KGD) issues are being resolved by several companies, and design tools to perform FC packaging designs are becoming more available. This is the infrastructure FC packaging requires to become the packaging method of choice, particularly for >200 I/O applications. FC packages come in a variety of styles: FC plastic ball grid arrays (FC/PBGAs), FC plastic quad flat packs (PC/PQFPs), etc. Presently, the industry´s drive is toward single chip packages on low cost laminates; i.e., organic substrates. Work is starting to occur in the area of multichip FC packages, due to the need to increase memory to microprocessor speed communication. In this article, a unique FC/MCM-L package is discussed. Part I will concentrate on the development and reliability testing of a one to four chip leadless FC/MCM-L package. Unlike traditional surface mount (SM) components that are attached to printed wiring boards (PWBs) with leads, the SM pads within the body of the package are used for attachment to a PWB. Collapsible eutectic solder domes are deposited on the SM pads by traditional screen printing. After reflow, these domes are used to connect the FC/MCM-L to the PWB. Challenges encountered during package design, PWB fabrication and first and second level assembly will be discussed. Part II of this article will focus on the extension of this FC/MCM-L package to a BGA second level interconnect. Change of FC attachment method, design enhancements, assembly, and reliability testing results will be presented
  • Keywords
    ball grid arrays; flip-chip devices; integrated circuit packaging; integrated circuit reliability; multichip modules; plastic packaging; soldering; BGA second level interconnect; bumped die; collapsible eutectic solder domes; electronics packaging; first level assembly; flip-chip MCM-L package; high density printed wiring boards; known good die; multichip FC packages; organic substrates; package design; plastic ball grid arrays; reliability testing; screen printing; second level assembly; single chip packages; Assembly; Costs; Electronics packaging; Laminates; Lead; Microprocessors; Plastic packaging; Samarium; Testing; Wiring;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/6040.784488
  • Filename
    784488